Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara. Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 117-124, IEEE Computer Society, 2007. [doi]
Abstract is missing.