Yuki Inoue, Hiroto Nagayoshi. Crack Detection as a Weakly-Supervised Problem: Towards Achieving Less Annotation-Intensive Crack Detectors. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 65-72, IEEE, 2020. [doi]
Abstract is missing.