Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara. Balanced Secure Scan: Partial Scan Approach for Secret Information Protection. J. Electronic Testing, 27(2):99-108, 2011. [doi]
@article{InoueYHF11,
title = {Balanced Secure Scan: Partial Scan Approach for Secret Information Protection},
author = {Michiko Inoue and Tomokazu Yoneda and Muneo Hasegawa and Hideo Fujiwara},
year = {2011},
doi = {10.1007/s10836-011-5204-0},
url = {http://dx.doi.org/10.1007/s10836-011-5204-0},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/InoueYHF11},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {27},
number = {2},
pages = {99-108},
}