Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam W. DiVergilio, Vibhor Jain, John J. Pekarik. Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{IoannouRBDJP21,
title = {Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs},
author = {Dimitris P. Ioannou and Uppili S. Raghunathan and Dave Brochu and Adam W. DiVergilio and Vibhor Jain and John J. Pekarik},
year = {2021},
doi = {10.1109/BCICTS50416.2021.9682453},
url = {https://doi.org/10.1109/BCICTS50416.2021.9682453},
researchr = {https://researchr.org/publication/IoannouRBDJP21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3990-9},
}