Atsushi Irie, Mutsuki Takagiwa, Kozo Moriyama, Takayoshi Yamashita. Improvements to facial contour detection by hierarchical fitting and regression. In First Asian Conference on Pattern Recognition, ACPR 2011, Beijing, China, 28-28 November, 2011. pages 273-277, IEEE, 2011. [doi]
Abstract is missing.