Sandra Irobi, Zaid Al-Ars, Said Hamdioui. Detecting memory faults in the presence of bit line coupling in SRAM devices. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 437-446, IEEE, 2010. [doi]
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