Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell. Influence of parasitic memory effect on single-cell faults in SRAMs. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 159-162, IEEE, 2011. [doi]
@inproceedings{IrobiAHR11,
title = {Influence of parasitic memory effect on single-cell faults in SRAMs},
author = {Sandra Irobi and Zaid Al-Ars and Said Hamdioui and Michel Renovell},
year = {2011},
doi = {10.1109/DDECS.2011.5783071},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783071},
researchr = {https://researchr.org/publication/IrobiAHR11},
cites = {0},
citedby = {0},
pages = {159-162},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}