Influence of parasitic memory effect on single-cell faults in SRAMs

Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell. Influence of parasitic memory effect on single-cell faults in SRAMs. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 159-162, IEEE, 2011. [doi]

Abstract

Abstract is missing.