Testing for Parasitic Memory Effect in SRAMs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Claude Thibeault. Testing for Parasitic Memory Effect in SRAMs. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 407-412, IEEE Computer Society, 2011. [doi]

This author has not been identified. Look up 'Sandra Irobi' in GoogleThis author has not been identified. Look up 'Zaid Al-Ars' in GoogleThis author has not been identified. Look up 'Said Hamdioui' in GoogleThis author has not been identified. Look up 'Claude Thibeault' in Google

runs on WebDSL