Mauro Isaja, Phu Hong Nguyen, Arda Goknil, Sagar Sen, Erik Johannes Husom, Simeon Tverdal, Abhilash Anand, Yunman Jiang, Karl John Pedersen, Per Myrseth, Jørgen Stang, Harris Niavis, Simon Pfeifhofer, Patrick Lamplmair. A blockchain-based framework for trusted quality data sharing towards zero-defect manufacturing. Computers in Industry, 146:103853, April 2023. [doi]
Abstract is missing.