Test of Bridging Faults in Scan-based Sequential Circuits - researchr publication authors

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Eugeni Isern, Joan Figueras. Test of Bridging Faults in Scan-based Sequential Circuits. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 366-370, IEEE Computer Society, 1994.

This author has not been identified. Look up 'Eugeni Isern' in GoogleThis author has not been identified. Look up 'Joan Figueras' in Google

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