Yukio Ishibashi, Masahiro Nagamatsu, Torao Yanaru. Accelerating concurrent fault simulation by parallel pattern emptiness checking of fault lists. Systems and Computers in Japan, 28(12):53-64, 1997. [doi]
@article{IshibashiNY97,
title = {Accelerating concurrent fault simulation by parallel pattern emptiness checking of fault lists},
author = {Yukio Ishibashi and Masahiro Nagamatsu and Torao Yanaru},
year = {1997},
doi = {10.1002/(SICI)1520-684X(19971115)28:12<53::AID-SCJ6>3.0.CO;2-C},
url = {http://dx.doi.org/10.1002/(SICI)1520-684X(19971115)28:12<53::AID-SCJ6>3.0.CO;2-C},
researchr = {https://researchr.org/publication/IshibashiNY97},
cites = {0},
citedby = {0},
journal = {Systems and Computers in Japan},
volume = {28},
number = {12},
pages = {53-64},
}