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Masahiro Ishida, Toru Nakura, Akira Matsukawa, Rimon Ikeno, Kunihiro Asada. A Technique for Analyzing On-Chip Power Supply Impedance. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 193-198, IEEE, 2015. [doi]