Yoshinao Ishii, Takuro Kutsuna. Effective Fault Localization Using Dynamic Slicing and an SMT Solver. In Ninth IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2016, Chicago, IL, USA, April 11-15, 2016. pages 180-188, IEEE Computer Society, 2016. [doi]
@inproceedings{IshiiK16,
title = {Effective Fault Localization Using Dynamic Slicing and an SMT Solver},
author = {Yoshinao Ishii and Takuro Kutsuna},
year = {2016},
doi = {10.1109/ICSTW.2016.20},
url = {http://doi.ieeecomputersociety.org/10.1109/ICSTW.2016.20},
researchr = {https://researchr.org/publication/IshiiK16},
cites = {0},
citedby = {0},
pages = {180-188},
booktitle = {Ninth IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2016, Chicago, IL, USA, April 11-15, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3674-5},
}