Yuzo Ishikawa, Martin Sirk, Ed Wishnow, Eric Korpela, Jerry Edelstein, James Curtis, Steven R. Gibson, Jeremy McCauley, Jason McPhate, Christopher Smith. Calibration techniques for the NASA ICON Extreme Ultraviolet Spectrograph (EUV). In James J. Butler, Xiaoxiong (Jack) Xiong, Xingfa Gu, editors, Earth Observing Systems XXI, SPIE Optical Engineering + Applications, San Diego, California, United States, 28 August - 1 September 2016. Volume 9972 of SPIE Proceedings, pages 997218, SPIE, 2016. [doi]
@inproceedings{IshikawaSWKECGM16,
title = {Calibration techniques for the NASA ICON Extreme Ultraviolet Spectrograph (EUV)},
author = {Yuzo Ishikawa and Martin Sirk and Ed Wishnow and Eric Korpela and Jerry Edelstein and James Curtis and Steven R. Gibson and Jeremy McCauley and Jason McPhate and Christopher Smith},
year = {2016},
doi = {10.1117/12.2238148},
url = {https://doi.org/10.1117/12.2238148},
researchr = {https://researchr.org/publication/IshikawaSWKECGM16},
cites = {0},
citedby = {0},
pages = {997218},
booktitle = {Earth Observing Systems XXI, SPIE Optical Engineering + Applications, San Diego, California, United States, 28 August - 1 September 2016},
editor = {James J. Butler and Xiaoxiong (Jack) Xiong and Xingfa Gu},
volume = {9972},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9781510603356},
}