Yuzo Ishikawa, Martin Sirk, Ed Wishnow, Eric Korpela, Jerry Edelstein, James Curtis, Steven R. Gibson, Jeremy McCauley, Jason McPhate, Christopher Smith. Calibration techniques for the NASA ICON Extreme Ultraviolet Spectrograph (EUV). In James J. Butler, Xiaoxiong (Jack) Xiong, Xingfa Gu, editors, Earth Observing Systems XXI, SPIE Optical Engineering + Applications, San Diego, California, United States, 28 August - 1 September 2016. Volume 9972 of SPIE Proceedings, pages 997218, SPIE, 2016. [doi]
Abstract is missing.