Masashi Ishikawa, Hiroyuki Yotsuyanagi, Masaki Hashizume. Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 163-166, IEEE Computer Society, 2010. [doi]
Abstract is missing.