Takashi Ishio, Shinpei Hayashi, Hiroshi Kazato, Tsuyoshi Oshima. On the effectiveness of accuracy of automated feature location technique. In Ralf Lämmel, Rocco Oliveto, Romain Robbes, editors, 20th Working Conference on Reverse Engineering, WCRE 2013, Koblenz, Germany, October 14-17, 2013. pages 381-390, IEEE, 2013. [doi]
Abstract is missing.