Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali, Liakot Ali. Development of an LFSR based test pattern generator for functional logic testing. In Proceedings of the 2003 10th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2003, Sharjah, United Arab Emirates, December 14-17, 2003. pages 591-594, IEEE, 2003. [doi]
Abstract is missing.