Development of a Cryogenic System for the Characterization of Advanced CMOS technologies down to 350 mK

Martínez-R. Ismael, Omar López-L, D. Ferrusca, M. Velázquez, E. A. Gutiérrez-D, D. Durini, F. J. De la Hidalga-W. Development of a Cryogenic System for the Characterization of Advanced CMOS technologies down to 350 mK. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

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