Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm - researchr publication related

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Noriyoshi Itazaki, Kozo Kinoshita. Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 105-112, IEEE Computer Society, 1986.

The following publications are possibly variants of this publication:

Test pattern generation for circuits with tri-state modules by Z-algorithmNoriyoshi Itazaki, Kozo Kinoshita. tcad, 8(12):1327-1334, 1989. [doi]

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