Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara. A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits. In IFIP VLSI-SoC 2006, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Nice, France, 16-18 October 2006. pages 308-313, IEEE, 2006. [doi]
@inproceedings{IwagakiOF06,
title = {A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits},
author = {Tsuyoshi Iwagaki and Satoshi Ohtake and Hideo Fujiwara},
year = {2006},
doi = {10.1109/VLSISOC.2006.313252},
url = {http://dx.doi.org/10.1109/VLSISOC.2006.313252},
tags = {testing},
researchr = {https://researchr.org/publication/IwagakiOF06},
cites = {0},
citedby = {0},
pages = {308-313},
booktitle = {IFIP VLSI-SoC 2006, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Nice, France, 16-18 October 2006},
publisher = {IEEE},
}