Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue. An Empirical Approach to RTL Scan Path Design Focusing on Structural Interpretation in Logic Synthesis. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 55-60, IEEE, 2019. [doi]
Abstract is missing.