Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada. Random benchmark circuits with controlled attributes. In European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997. pages 90-97, IEEE, 1997. [doi]
@inproceedings{IwamaHKS97,
title = {Random benchmark circuits with controlled attributes},
author = {Kazuo Iwama and Kensuke Hino and Hiroyuki Kurokawa and Sunao Sawada},
year = {1997},
doi = {10.1109/EDTC.1997.582338},
url = {http://dx.doi.org/10.1109/EDTC.1997.582338},
researchr = {https://researchr.org/publication/IwamaHKS97},
cites = {0},
citedby = {0},
pages = {90-97},
booktitle = {European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997},
publisher = {IEEE},
}