T. Iwamoto, S. Kobashi, Narumi Sakashita, J. Mitsuishi, Ken-ichi Tanaka, Kazuo Kyuma. Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms. In Nikola Kasabov, Robert Kozma 0001, Kitty Ko, Robert O'Shea, George Coghill, Tom Gedeon, editors, Progress in Connectionist-Based Information Systems: Proceedings of the 1997 International Conference on Neural Information Processing and Intelligent Information Systems, ICONIP 1997, Volume I, Dunedin, New Zealand, 24-28 November, 1997. pages 704-707, Springer, 1997.
@inproceedings{IwamotoKSMTK97,
title = {Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms},
author = {T. Iwamoto and S. Kobashi and Narumi Sakashita and J. Mitsuishi and Ken-ichi Tanaka and Kazuo Kyuma},
year = {1997},
researchr = {https://researchr.org/publication/IwamotoKSMTK97},
cites = {0},
citedby = {0},
pages = {704-707},
booktitle = {Progress in Connectionist-Based Information Systems: Proceedings of the 1997 International Conference on Neural Information Processing and Intelligent Information Systems, ICONIP 1997, Volume I, Dunedin, New Zealand, 24-28 November, 1997},
editor = {Nikola Kasabov and Robert Kozma 0001 and Kitty Ko and Robert O'Shea and George Coghill and Tom Gedeon},
publisher = {Springer},
isbn = {0-444-88545-5},
}