Hiroshi Iwata, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara. Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 206-211, IEEE Computer Society, 2010. [doi]
Abstract is missing.