Huffman encoding of test sets for sequential circuits

Vikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray. Huffman encoding of test sets for sequential circuits. IEEE T. Instrumentation and Measurement, 47(1):21-25, 1998. [doi]

@article{IyengarCM98-0,
  title = {Huffman encoding of test sets for sequential circuits},
  author = {Vikram Iyengar and Krishnendu Chakrabarty and Brian T. Murray},
  year = {1998},
  doi = {10.1109/19.728782},
  url = {http://dx.doi.org/10.1109/19.728782},
  researchr = {https://researchr.org/publication/IyengarCM98-0},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {47},
  number = {1},
  pages = {21-25},
}