Anirudh Srikant Iyengar, Swaroop Ghosh, Jae-Won Jang. MTJ-Based State Retentive Flip-Flop With Enhanced-Scan Capability to Sustain Sudden Power Failure. IEEE Trans. on Circuits and Systems, 62-I(8):2062-2068, 2015. [doi]
@article{IyengarGJ15,
title = {MTJ-Based State Retentive Flip-Flop With Enhanced-Scan Capability to Sustain Sudden Power Failure},
author = {Anirudh Srikant Iyengar and Swaroop Ghosh and Jae-Won Jang},
year = {2015},
doi = {10.1109/TCSI.2015.2440738},
url = {http://dx.doi.org/10.1109/TCSI.2015.2440738},
researchr = {https://researchr.org/publication/IyengarGJ15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {62-I},
number = {8},
pages = {2062-2068},
}