MTJ-Based State Retentive Flip-Flop With Enhanced-Scan Capability to Sustain Sudden Power Failure

Anirudh Srikant Iyengar, Swaroop Ghosh, Jae-Won Jang. MTJ-Based State Retentive Flip-Flop With Enhanced-Scan Capability to Sustain Sudden Power Failure. IEEE Trans. on Circuits and Systems, 62-I(8):2062-2068, 2015. [doi]

Abstract

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