Delay Test Generation 1: Concepts and Coverage Metrics

Vijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger. Delay Test Generation 1: Concepts and Coverage Metrics. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 857-866, IEEE Computer Society, 1988.

Authors

Vijay S. Iyengar

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Barry K. Rosen

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Ilan Y. Spillinger

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