Error Detection Using BMC in a Parallel Environment

Subramanian K. Iyer, Jawahar Jain, Mukul R. Prasad, Debashis Sahoo, Thomas Sidle. Error Detection Using BMC in a Parallel Environment. In Dominique Borrione, Wolfgang J. Paul, editors, Correct Hardware Design and Verification Methods, 13th IFIP WG 10.5 Advanced Research Working Conference, CHARME 2005, Saarbrücken, Germany, October 3-6, 2005, Proceedings. Volume 3725 of Lecture Notes in Computer Science, pages 354-358, Springer, 2005. [doi]

@inproceedings{IyerJPSS05,
  title = {Error Detection Using BMC in a Parallel Environment},
  author = {Subramanian K. Iyer and Jawahar Jain and Mukul R. Prasad and Debashis Sahoo and Thomas Sidle},
  year = {2005},
  doi = {10.1007/11560548_30},
  url = {http://dx.doi.org/10.1007/11560548_30},
  tags = {meta-model, Meta-Environment, meta-objects},
  researchr = {https://researchr.org/publication/IyerJPSS05},
  cites = {0},
  citedby = {0},
  pages = {354-358},
  booktitle = {Correct Hardware Design and Verification Methods, 13th IFIP WG 10.5 Advanced Research Working Conference, CHARME 2005, Saarbrücken, Germany, October 3-6, 2005, Proceedings},
  editor = {Dominique Borrione and Wolfgang J. Paul},
  volume = {3725},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-29105-9},
}