Eva Jabbar, Philippe C. Besse, Jean-Michel Loubes, Christophe Merle. Conditional Anomaly Detection for Quality and Productivity Improvement of Electronics Manufacturing Systems. In Giuseppe Nicosia, Panos M. Pardalos, Renato Umeton, Giovanni Giuffrida, Vincenzo Sciacca, editors, Machine Learning, Optimization, and Data Science - 5th International Conference, LOD 2019, Siena, Italy, September 10-13, 2019, Proceedings. Volume 11943 of Lecture Notes in Computer Science, pages 711-724, Springer, 2019. [doi]
Abstract is missing.