M. Jablonski, Riccardo Lucchini, Frederick Bossuyt, Thomas Vervust, Jan Vanfleteren, J. W. C. DeVries, Pasquale Vena, Mario Gonzalez. Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability. Microelectronics Reliability, 55(1):143-154, 2015. [doi]
@article{JablonskiLBVVDV15,
title = {Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability},
author = {M. Jablonski and Riccardo Lucchini and Frederick Bossuyt and Thomas Vervust and Jan Vanfleteren and J. W. C. DeVries and Pasquale Vena and Mario Gonzalez},
year = {2015},
doi = {10.1016/j.microrel.2014.09.009},
url = {http://dx.doi.org/10.1016/j.microrel.2014.09.009},
researchr = {https://researchr.org/publication/JablonskiLBVVDV15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {1},
pages = {143-154},
}