Chris Jacobsen, Tony Saye, Tom Trader. Safely backdriving low voltage devices at in-circuit test. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 7, IEEE, 2005. [doi]
@inproceedings{JacobsenST05, title = {Safely backdriving low voltage devices at in-circuit test}, author = {Chris Jacobsen and Tony Saye and Tom Trader}, year = {2005}, doi = {10.1109/TEST.2005.1583973}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583973}, researchr = {https://researchr.org/publication/JacobsenST05}, cites = {0}, citedby = {0}, pages = {7}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }