A recursive system identification method based on binary measurements

Kian Jafari, Jérôme Juillard, Éric Colinet. A recursive system identification method based on binary measurements. In Proceedings of the 49th IEEE Conference on Decision and Control, CDC 2010, December 15-17, 2010, Atlanta, Georgia, USA. pages 1154-1158, IEEE, 2010. [doi]

Abstract

Abstract is missing.