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Defect Analysis and Reliability Assessment for Transactional Web Applications

Wafa Jaffal, Jeff Tian. Defect Analysis and Reliability Assessment for Transactional Web Applications. In 25th IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Naples, Italy, November 3-6, 2014. pages 245-250, IEEE, 2014. [doi]

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Wafa Jaffal

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Jeff Tian

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