Wafa Jaffal, Jeff Tian. Defect Analysis and Reliability Assessment for Transactional Web Applications. In 25th IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Naples, Italy, November 3-6, 2014. pages 245-250, IEEE, 2014. [doi]
@inproceedings{JaffalT14,
title = {Defect Analysis and Reliability Assessment for Transactional Web Applications},
author = {Wafa Jaffal and Jeff Tian},
year = {2014},
doi = {10.1109/ISSREW.2014.12},
url = {http://dx.doi.org/10.1109/ISSREW.2014.12},
researchr = {https://researchr.org/publication/JaffalT14},
cites = {0},
citedby = {0},
pages = {245-250},
booktitle = {25th IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Naples, Italy, November 3-6, 2014},
publisher = {IEEE},
isbn = {978-1-4799-7377-4},
}