Javid Jaffari, Mohab Anis. Statistical Thermal Profile Considering Process Variations: Analysis and Applications. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(6):1027-1040, 2008. [doi]
@article{JaffariA08a, title = {Statistical Thermal Profile Considering Process Variations: Analysis and Applications}, author = {Javid Jaffari and Mohab Anis}, year = {2008}, doi = {10.1109/TCAD.2008.923251}, url = {http://dx.doi.org/10.1109/TCAD.2008.923251}, tags = {analysis}, researchr = {https://researchr.org/publication/JaffariA08a}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, volume = {27}, number = {6}, pages = {1027-1040}, }