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Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti. Impact of Temperature on Test Quality. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 276-281, IEEE, 2010. [doi]

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