Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, Ananta K. Majhi. Efficient Grouping of Fail Chips for Volume Yield Diagnostics. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 97-102, IEEE, 2009. [doi]
Abstract is missing.