Marco Jähnisch, Marc Shiffner. Stereoscopic Depth-detection for Handling and Manipulation Tasks in a Scanning Electron Microscope. In Proceedings of the 2006 IEEE International Conference on Robotics and Automation, ICRA 2006, May 15-19, 2006, Orlando, Florida, USA. pages 908-913, IEEE, 2006.
@inproceedings{JahnischS06, title = {Stereoscopic Depth-detection for Handling and Manipulation Tasks in a Scanning Electron Microscope}, author = {Marco Jähnisch and Marc Shiffner}, year = {2006}, researchr = {https://researchr.org/publication/JahnischS06}, cites = {0}, citedby = {0}, pages = {908-913}, booktitle = {Proceedings of the 2006 IEEE International Conference on Robotics and Automation, ICRA 2006, May 15-19, 2006, Orlando, Florida, USA}, publisher = {IEEE}, }