Vijay K. Jain, Glenn H. Chapman. Massively Deployable Intelligent Sensors for the Smart Power Grid. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 319-327, IEEE Computer Society, 2010. [doi]
@inproceedings{JainC10,
title = {Massively Deployable Intelligent Sensors for the Smart Power Grid},
author = {Vijay K. Jain and Glenn H. Chapman},
year = {2010},
doi = {10.1109/DFT.2010.46},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2010.46},
researchr = {https://researchr.org/publication/JainC10},
cites = {0},
citedby = {0},
pages = {319-327},
booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-8447-8},
}