Vijay K. Jain, Glenn H. Chapman. Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 235-242, IEEE, 2011. [doi]
Abstract is missing.