Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features

Anil K. Jain, Yi Chen, Meltem Demirkus. Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features. IEEE Trans. Pattern Anal. Mach. Intell., 29(1):15-27, 2007. [doi]

Abstract

Abstract is missing.