Mind the Gap: The Difference Between Coverage and Mutation Score Can Guide Testing Efforts - researchr publication authors

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Kush Jain, Goutamkumar Tulajappa Kalburgi, Claire Le Goues, Alex Groce. Mind the Gap: The Difference Between Coverage and Mutation Score Can Guide Testing Efforts. In 34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023. pages 102-113, IEEE, 2023. [doi]

This author has not been identified. Look up 'Kush Jain' in GoogleThis author has not been identified. Look up 'Goutamkumar Tulajappa Kalburgi' in GoogleThis author has not been identified. Look up 'Claire Le Goues' in GoogleThis author has not been identified. Look up 'Alex Groce' in Google

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