Kush Jain, Goutamkumar Tulajappa Kalburgi, Claire Le Goues, Alex Groce. Mind the Gap: The Difference Between Coverage and Mutation Score Can Guide Testing Efforts. In 34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023. pages 102-113, IEEE, 2023. [doi]
Abstract is missing.