Achin Jain, Alok R. Patnaik, Pulak Dhar, Vineet Srivastava 0002. Software Defect Content Estimation: A Bayesian Approach. In Proceedings of the Canadian Conference on Electrical and Computer Engineering, CCECE 2007, May 7, 10, 2006, Ottawa Congress Centre, Ottawa, Canada. pages 2449-2454, IEEE, 2006. [doi]
Abstract is missing.