Test strategy for microprocessers

Sunil K. Jain, Alfred K. Susskind. Test strategy for microprocessers. In Charles E. Radke, editor, Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983. pages 703-708, ACM/IEEE, 1983. [doi]

Authors

Sunil K. Jain

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Alfred K. Susskind

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