Sunil K. Jain, Charles E. Stroud. Built-in Self Testing of Embedded Memories. IEEE Design & Test of Computers, 3(5):27-37, 1986. [doi]
@article{JainS86-0,
title = {Built-in Self Testing of Embedded Memories},
author = {Sunil K. Jain and Charles E. Stroud},
year = {1986},
doi = {10.1109/MDT.1986.295041},
url = {https://doi.org/10.1109/MDT.1986.295041},
researchr = {https://researchr.org/publication/JainS86-0},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {3},
number = {5},
pages = {27-37},
}