Arvind Jain, Sundarrajan Subramanian, Rubin A. Parekhji, Srivaths Ravi. Multi-CoDec Configurations for Low Power and High Quality Scan Test. In VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011. pages 370-375, IEEE, 2011. [doi]
Abstract is missing.